Find Part Number 9042833-01 With NSN 5961-01-375-1418 by Nanometrics Incorporated!

Part Number: 9042833-01

Alternate P/N: 904283301

Manufacturer: Nanometrics Incorporated

NSN: 5961-01-375-1418

NIIN: 013751418

Item Name : Semiconductor Device Thyristor

CAGE Code: 62055

FSC: 5961 Semiconductor Devices and Associated Hardware

FSG: 59 Electrical and Electronic Equipment Components

Country: USA

NCB Code: 01

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NSN Information for Part Number 9042833-01 with NSN 5961-01-375-1418, 5961013751418

NSN	FSC	NIIN	CLS	Hazmat	DEMIL	Cancelled NSN
5961-01-375-1418 Item PartTypeName: SEMICONDUCTOR DEVICE,THYRISTOR	5961	013751418	0	N	B
	CIIC	HCC	ESD	PMIC	Criticality	ENAC
	U		B	A	0
Part Number	ISC	RNVC	RNCC	HCC	MSDS	SADC
9042833-01	5	2	3

Characteristics Data of NSN 5961-01-375-1418, 5961013751418

MRC	Criteria	Characteristic
ABHP	OVERALL LENGTH	0.330 INCHES MINIMUM AND 0.505 INCHES MAXIMUM
ZZZK	SPECIFICATION/STANDARD DATA	81349-MIL-S-19500/108 GOVERNMENT SPECIFICATION
ABBH	INCLOSURE MATERIAL	METAL
AKPV	MOUNTING FACILITY QUANTITY	1
THSD	THREAD SERIES DESIGNATOR	UNF
ALAS	INTERNAL CONFIGURATION	JUNCTION CONTACT
AXGY	MOUNTING METHOD	THREADED STUD
CCDG	OVERALL WIDTH ACROSS FLATS	0.544 INCHES MINIMUM AND 0.562 INCHES MAXIMUM
CRTL	CRITICALITY CODE JUSTIFICATION	NHCF
CTQN	VOLTAGE RATING IN VOLTS PER CHARACTERISTIC	2.0 MAXIMUM FORWARD VOLTAGE,PEAK AND 3.0 MAXIMUM GATE TRIGGER VOLTAGE,DC
CTSG	MAXIMUM OPERATING TEMP PER MEASUREMENT POINT	125.0 DEG CELSIUS AMBIENT AIR
FEAT	SPECIAL FEATURES	HCI & ESD; JUNCTION PATTERN ARRANGEMENT: PNPN
NHCF	NUCLEAR HARDNESS CRITICAL FEATURE	HARDENED
CBBL	FEATURES PROVIDED	ELECTROSTATIC SENSITIVE AND HERMETICALLY SEALED CASE
CQJX	NOMINAL THREAD SIZE	0.250 INCHES
CTMZ	SEMICONDUCTOR MATERIAL	SILICON
CTQX	CURRENT RATING PER CHARACTERISTIC	16.00 AMPERES MAXIMUM AVERAGE ON-STATE CURRENT,180 DEGREES CONDUCTION ANGLE,AVERAGE OVER A FULL 60-HZ CYCLE
SPCL	SPECIAL TEST FEATURES	SELECTED AND TESTED FOR APPLICATION IN RADIATION HARDNESS CRITICAL SYSTEMS
TTQY	TERMINAL TYPE AND QUANTITY	28 TAB,SOLDER LUG AND 1 THREADED STUD