We appreciate your interest in our selection of parts that fall under the NSN 6625-01-577-7189. Below, top-requested part numbers like PD09WRGBEC24, MIL-HDBK-300-ATS, and others are presented alongside their manufacturer for your perusal. In order to receive pricing options on any featured NSN 6625-01-577-7189, simply click on the “RFQ” button next to it and complete the quote request form you are directed to. Be sure to include as many details as you can about your requirements and restrictions alike so our team can best formulate ideal fulfillment options for your consideration.
Owned and operated by the NSN parts supplier ASAP Semiconductor, National Stock Numbers Quotes is only stocked with items that meet strict regulatory and statutory guidelines for export compliance and quality assurance. Moreover, all NSN 6625-01-577-7189 items on this page are sourced from leading manufacturers that we trust and have vetted as necessary. Aside from this steadfast commitment, we also aim to address the unique constraints of customers wherever possible, even if other channels have failed to. If you have any further questions about the services we offer or wish to discuss your needs directly, our representatives are always just a call or email away from assisting you!
| Item Name | Test Set Semiconduc |
| Federal Supply Group (FSG) | Instruments and Laboratory Equipment |
| Federal Supply Class (FSC) | 6625 Electrical and Electronic Properties Measuring and Testing Instruments |
| National Item Identification Number (NIIN) | 01-577-7189 (015777189) |
| NCB Code | USA (01) |
| Manufacturer | Warner Robins Air Logistics Center, Mil Hdbk 300 |
| Part Number | Manufacturer | Item Name | RFQ |
|---|---|---|---|
| PD09WRGBEC24 | warner robins air logistics center | test set semiconduc | RFQ |
| MIL-HDBK-300-ATS | mil hdbk 300 | test set semiconduc | RFQ |
| MIL-HDBK-300-ATS | warner robins air logistics center | test set semiconduc | RFQ |
| PD09WRGBEC24 | mil hdbk 300 | test set semiconduc | RFQ |
| MRC | Criteria | Characteristic |
|---|---|---|
| ZZZP | III PURCHASE DESCRIPTION IDENTIFICATION | 98752-PD09WRGBEC24 |
| ANPZ | INCLOSURE FEATURE | SINGLE ITEM W/HOUSING |
| ALSF | INTERNAL BATTERY ACCOMMODATION | NOT INCLUDED |
| NTRD | III ENTRY DATE | 09-09-08 |
| FEAT | SPECIAL FEATURES | MEETS MIL-PRF-28800 CLASS 3 |
| FAAZ | PHASE | SINGLE |
| FCLS | III FUNCTIONAL CLASSIFICATION | AA-9.6 |
| AQXY | TEST TYPE FOR WHICH DESIGNED | IN-CIRCUIT ELECTRONIC COMPONENT TESTING |
| ACZB | FREQUENCY RATING | 50.0 HERTZ MINIMUM AND 400.0 HERTZ MAXIMUM |
| AFHS | ACCESSORY COMPONENT QUANTITY | 5 |
| FTLD | III FUNCTIONAL DESCRIPTION | USED TO IN-CIRCUIT TEST SEMICONDUCTOR COMPONENTS |
| ACYN | AC VOLTAGE RATING | 110.0 VOLTS NOMINAL OR 240.0 VOLTS NOMINAL |
| CXCY | III PART NAME ASSIGNED BY CONTROLLING AGENCY | TEST SET,SEMICONDUCTOR |
| AKWC | ELECTRICAL POWER SOURCE RELATIONSHIP | OPERATING |
| AEAS | MAJOR COMPONENTS | TEST SET; PAIR MICROPROBES; COMMON TEST LEADS; SHROUDED TEST LEAD; POWER CORD; CD MANUAL |
| Relevant Components for NSN - 6625-01-577-7189, 6625015777189 | ||||
| 6625-01-246-7270 (6625012467270) | 6685-01-301-8708 (6685013018708) | 6625-01-060-5124 (6625010605124) | 6660-01-199-5928 (6660011995928) | |
| 6640-01-293-9243 (6640012939243) | 6685-01-016-4546 (6685010164546) | 6625-01-104-7816 (6625011047816) | 6640-00-427-3960 (6640004273960) | |
| 6625-00-821-6900 (6625008216900) | 6625-00-061-1459 (6625000611459) | 6630-01-542-0352 (6630015420352) | 6615-00-590-0079 (6615005900079) | |
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